NOTE: The E1976AU is used for existing E1976A customers to add new features requiring feature options.
The Keysight E1976A 1xEV-DO Factory Test Mode Test Application, which runs on the industry standard 8960 (E5515C/E) wireless communications test set, delivers comprehensive RF parametric test capabilities to verify the RF performance of your 1xEV-DO wireless access terminals in factory test mode. The factory test mode supported by Qualcomm®.
The E1976A, which is a subset of the E1966A 1xEV-DO Mobile Test Application, is developed for R&D engineers and production test engineers to test the wireless access terminal’s physical channel performance through test mode, rather than call processing. The test requires external serial port control of the mobile device.
Order E1976A(U)-102 to get the 1xEV-DO Release A and Release B factory test mode functionality. Because this solution is based on the high-performance E5515C/E test set, you gain the additional benefits of extremely fast measurement speed, ease of programming, accuracy, repeatability, and worldwide service and support. These proven features help you shorten test development time, increase throughput, and minimize support costs.
Detailed revision information for this release can be found in the online user guide in the library.
Easily upgrade the 8960 (E5515C/E) for testing multiple technologies
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